X RAY TRUVIEW PRIME
Is used as generic X-ray inspection system, PCB inspection (BGA and QFN), it can also analyze a high magnification mode (using a transmissive x ray source).
Our engineers mainly use this radiography analysis machine to detect semiconductor failure, for pin out, damaged hardware, voids, and matching to device blueprint analysis with geometric magnification to 1 000 X.
IC DETECTOR ABI SENTRY
Is aimed at goods inwards inspectors and designed to measure the unique electrical signature PinPrint of components. The information collected is managed through a database and is used to compare known good devices against suspect components.
This machine reinforce the analysis of the electronics components and to verify the internal impedance of component.
ACETONE test can detect if there is any false coating on the part and if it has been remarked. It can determine the component authenticity.
MICROSCOPE EUROMEX StereoBlue SB.1903-P
Is used in examining part marking, checking if leads have been re-attached or retinned, oxidation etc. to determine if a component is refurbished, counterfeit or in good or bad condition.
is an extremely fast universal USB/LPT interfaced programmer supporting over 100,000 devices.Our engineers mainly use this machine to test blanks, blocks, product identification,memory read/write, and/or erase functions.
Vacuum packaging machine specific for semiconductors to avoid damaging the delicate pins during the packaging process.
Reeling Machine for pieces coming from tubes or bags.
To verify that the values of Resistors, Capacitors and Inductances are correct.
QUICK DRYING AND HUMIDITY CONTROL CABINET TO STORE MSL
Moisture sensitive components or return them to their original state if they have not been stored or received in optimal humidity conditions
JETECH PRO DECAPSULATION
Jetech Pro is the industry-leading decapsulation system for detecting for semiconductor failure analysis and counterfeit protection during the verification process.